ISSN 0236-235X (P)
ISSN 2311-2735 (E)

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4
Publication date:
16 December 2019
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Keyword: integrated scheme

  1. Algorithmic basis of tests generation taking into account radiating influence
  2. Authors: Конарев М.В.

  3. External destabilizing factors influence on integrated circuit low-frequency noise
  4. Authors: Горлов М.И., Жуков Д.М.