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№1
Publication date:
16 March 2021
Keyword: random test generation
- The development of the system for microprocessor random testing INTEG Authors: Грибков И.В., Захаров А.В., Кольцов П.П., Котович Н.В., Кравченко А.А., Куцаев А.С., Осипов А.С., Хисамбеев И.Ш., Коганов М.А.
- Role of stochastic testing in microprocessors functional verification Authors: Хисамбеев И.Ш.
