ISSN 0236-235X (P)
ISSN 2311-2735 (E)

Journal influence

Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)

Bookmark

Next issue

2
Publication date:
16 June 2024

Verstov V.A.

(v.verstov@gmail.com)
Bauman Moscow State Technical University
Author in:
  1. Visual analytics support system of VLSI layout design for double patterning technology
  2. Co-authors: Zinchenko L.A., Shakhnov V.A., Makarchuk V.V.