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Software & Systems
ISSN 0236-235X (P)
ISSN 2311-2735 (E)
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4
Publication date:
09 September 2024
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2024
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Keyword: integrated scheme
Algorithmic basis of tests generation taking into account radiating influence
Authors:
Конарев М.В.
External destabilizing factors influence on integrated circuit low-frequency noise
Authors:
Горлов М.И.
,
Жуков Д.М.