ISSN 0236-235X (P)
ISSN 2311-2735 (E)

Journal influence

Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)


Next issue

Publication date:
13 September 2024

Keyword: the logic gate

  1. The automated training system of technical diagnostics
  2. Authors: Баин А.М.

  3. Nanotransitors circuitry simulation problems with silicon-on-insulator structure
  4. Authors: Масальский Н.В.