Journal influence
Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)
Bookmark
Next issue
№4
Publication date:
09 September 2024
Keyword: random test generation
- The development of the system for microprocessor random testing INTEG Authors: Грибков И.В., Захаров А.В., Кольцов П.П., Котович Н.В., Кравченко А.А., Куцаев А.С., Осипов А.С., Хисамбеев И.Ш., Коганов М.А.
- Role of stochastic testing in microprocessors functional verification Authors: Хисамбеев И.Ш.