ISSN 0236-235X (P)
ISSN 2311-2735 (E)

Journal influence

Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)


Next issue

Publication date:
13 September 2024

Keyword: CMOS

  1. Model of radiation effects from heavy charged particles In CMOS elements of microchips
  2. Authors: Беляева Т.П., Зольников К.В., Таперо К.И., Смерек В.А.