ISSN 0236-235X (P)
ISSN 2311-2735 (E)

Journal influence

Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)


Next issue

Publication date:
13 September 2024

Ph.D (
Author in:
  1. Optimisation of certified tests 0lectronics products of the foreign manufacture
  2. Co-authors: Ершов Л.А., Бабенко В.А., Уханов А.В.
  3. Bases of a rational choice electronic components of the foreign manufacture
  4. Co-authors: Ершов Л.А., Уханов А.В., Панкратов В.К.