ISSN 0236-235X (P)
ISSN 2311-2735 (E)

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Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)

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4
Publication date:
09 September 2024

Verstov V.A.

(v.verstov@gmail.com)
Bauman Moscow State Technical University
Author in:
  1. Visual analytics support system of VLSI layout design for double patterning technology
  2. Co-authors: Zinchenko L.A., Shakhnov V.A., Makarchuk V.V.