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Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)
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№4
Publication date:
09 December 2024
Keyword: single event effects
- Integrated circuits elements optimization for single-event prevention Authors: Шунков В.Е.
- A fault injector to test the SoC-processor to single event upsets Authors: Чекмарёв С.А.