Journal influence
Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)
Bookmark
Next issue
№4
Publication date:
09 December 2024
Verstov V.A.
(v.verstov@gmail.com)
Bauman Moscow State Technical University
Author in:
- Visual analytics support system of VLSI layout design for double patterning technology Co-authors: Zinchenko L.A., Shakhnov V.A., Makarchuk V.V.